|

EDX6000B is newly developed by Skyray for cement and mineral industries with in-built movable table. It can test several samples simultaneously through easy and simple operation.
Instrument delivers professional full-element analysis of cement, steel, minerals, plating thickness and hazardous substances (RoHS/WEEE)
Applications
Cement Ferrous and non-ferrous metals Aggregate RoHS testing
Performance characteristics
Electric-cooling UHRD detector instead of liquid nitrogen cooling detector In-built SNE improves the signal processing ability up to 25 times. Vacuum sample chamber, good for analyzing low content light elements The collimators and filters can be switched automatically for different samples. Arbitrary optional analysis and identification models Independent matrix effect correction models Multi-variable non-linear regression procedure Intelligent full-element analysis software matches with the hardware well
| Specifications |
|
Model
|
EDX 6000B, proffesional EDXRF Spectrometer for full-element analysis
|
|
Detector
|
Si-PIN detector electrically cooled, UHRD technology
|
|
Excitation source
|
X-ray tube,
|
|
Tube current
|
50-1000 µA
|
|
Tube voltage
|
5-50 kV
|
|
Test time
|
60-200 s
|
|
Measured elements
|
From Na to U, improved precision for light elements
|
|
Analysis range
|
1 ppm - 99,99%, for Cd/Pb/Cr/Hg/Br detection limit reaches 1 ppm
|
|
Measurement precision
|
0,05% (above 96%)
|
|
Simultaneous analysis
|
24 elements
|
|
Forms of samples
|
solid, powder and liquid
|
|
Measured layers
|
11 layers, up to 0,005 µm thick
|
|
Sample positioning
|
High resolution CCD camera 1,4 mln pix.
|
|
Collimators
|
Collimators and filters can be switched automatically for different samples.
|
|
Power
|
110/220 VAC +/- 5V (recommended stabilized voltage power supply)
|
|
Ambient temperature
|
+15 °C to + 30 °C
|
|
Ambient humidity
|
≤ 70%
|
|
Standard configurations
|
High efficient ultra thin end window X-ray tube, Electric-cooling UHRD detector, Signal-to-Noise Enhancer (SNE), In-built high resolution CCD, Light path enhancement system, Automatic collimator and filter switch, Enhanced metal sensitivity analyzer
|
|
|

|
This specification can be changed without prior notice.
|
|