Energy dispersive X-ray fluorescence spectrometry (EDXRF) is used for accurate and non-destructive analysis of certain elements in a given sample. When a wave of light energy (X-ray or photon) is absorbed by an atom, electrons from the inner shells are ejected, and their place are occupied by the outer orbital electrons. The energy emitted during this transition is in the form of secondary X-ray radiation (fluorescence). Each element has its characteristic energy and emitted radiation range. Measuring its extent and intensity allows identification and determination the content of the element.
Other methods of elemental analysis (AAS, ICP, WDXRF) or chemical analysis cause the destruction of samples, have serious limitations on the scope of analysis, are expensive to buy and operate and are large and cumbersome to use.
EDXRF spectrometers have no such restrictions and are therefore often chosen for many different applications. Depending on the model of spectrometers conduct element analysis of the sodium (Na) to uranium (U) in the solids, liquids and powder material. Both laboratory and portable models successfully perform dangerous element analysis (according to RoHS, WEEE, Prop-65, etc.), conduct analyzes of steel alloys and non-ferrous alloys, determine composition the jewelry or carat value of gold, conduct measurements of the thickness and composition of metallic coatings analysis of mineral raw materials, such as ceramics eg. derived from excavations, examine the contents of metals and other elements in fuels, soil, water, and many others.
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