XRF spectrometer EDX 3000 is designed primarily for the analysis of precious metals in jewelry samples, coating thickness testing, testing RoHS Compliance. By using electrically-cooled Si-PIN detector with improved resolution enables separation of more complex alloys jewelry eg. white gold. Built-in camera allows precise measurement of selected point, which is especially important in the measurement of objects with low or irregular shapes such as rings, necklaces, etc. The spectrometer has an easy-to-use analysis software and the ability to add your own standards and create new calibration curves. Analysis by X-ray fluorescence XRF spectrometers are completely non-destructive, allow measurements of both raw materials and finished products.
