Spectrometer XRF EDX6000B

Spectrometer XRF EDX6000B

XRF spectrometer EDX 6000B is a fully professional EDXRF spectrometer for fast and non-destructive analysis of the chemical composition, equipped with a modern electrically-cooled SDD detector. Due to the high sensitivity guarantees a high level of energy linearity properties of the spectrum and the high peak-to-background ratio. The spectrometer comes with a 10-position tray that allows quick and easy test multiple samples simultaneously. It is recommended for the analysis of samples of mineral and metal alloys in the cement industry, electroplating, metallurgy, etc. XRF X-ray fluorescence method works well in scientific research, where the user has only a small amount of the sample. In this model of XRF analyzer it is possible to perform calibration for analyzes RoHS Compliance with low detection limits for hazardous elements covered by Directive.

Additional Info

Model: EDX 6000B, proffesional EDXRF Spectrometer for full-element analysis
Application: Science and Research, Industry, Geology, RoHS, Alloy analysis, Catalyst analysis
Analysis range: 1 ppm - 99,99%, for Cd/Pb/Cr/Hg/Br detection limit reaches 1 ppm
Detector: SDD
Energy resolution: approx. 145 eV
Measured elements: B, C, N, O, F, Ne, Na, Mg, Al, Si, P, S, Cl, Ar, K, Ca, Sc, Ti, V, Cr, Mn, Fe, Co, Ni, Cu, Zn, Ga, Ge, As, Se, Br, Kr, Rb, Sr, Y, Zr, Nb, Mo, Tc, Ru, Rh, Pd, Ag, Cd, In, Sn, Sb, Te, I, Xe, Cs, Ba, La, Ce, Pr, Nd, Pm, Sm, Eu, Gd, Tb, Dy, Ho, Er, Tm, Yb, Lu, Hf, Ta, W, Re, Os, Ir, Pt, Au, Hg, Tl, Pb, Bi, Po, At, Rn, Fr, Ra, Ac, Th, Pa, U, Np, Pu, Am, Cm, Bk, Cf, Es, Fm
Measurement precision: 0,05% (above 96%)
Measurement atmosphere: Air, vacuum (optional)
Test time: 10-200 seconds
Tube power: 50W
Power: 230V AC
Forms of samples: solid, powder and liquid
Dimensions: 650 x 608 x 466 cm
Additional informations: Standard configuration: the main unit with SDD detector, laser sight, a CCD camera, a set of computer software with elements of FP and a set of filters and collimators and a vacuum pump
Published in Spectrometers XRF
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