Coating thickness analysers
EnviSense XRF coating thickness analysers measure the thickness and composition of electroplated coatings by X-ray fluorescence — non-destructively and without damaging the part under test. They suit single, double and composite coatings, and thanks to a dual positioning system and a choice of collimators they also handle small and irregular shapes. We will match the analyser to the type of coating and the sample geometry.
Coating thickness analysers — available models
EDX 2000A XRF spectrometer
The EDX 2000A XRF spectrometer with a top radiation source and a moving stage is designed to measure the thickness and composition of electroplated coatings. A dual sample-positioning system and a wide choice of collimators enable precise measurement of small and irregular parts. Element range from aluminium to uranium.
- Top radiation source and a moving stage
- Thickness and composition of electroplated coatings
- Dual sample-positioning system
- Wide choice of collimators for small parts