EDX 2000A XRF spectrometer
The EDX 2000A XRF spectrometer with a top radiation source and a moving stage is designed to measure the thickness and composition of electroplated coatings. A dual sample-positioning system and a wide choice of collimators enable precise measurement of small and irregular parts. Element range from aluminium to uranium.
- Top radiation source and a moving stage
- Thickness and composition of electroplated coatings
- Dual sample-positioning system
- Wide choice of collimators for small parts
- Single, double and composite coatings
- Element range from aluminium to uranium
The EDX 2000A XRF spectrometer with a top radiation source and a moving stage was designed specifically to measure the thickness and composition of electroplated coatings. The non-destructive X-ray fluorescence method lets you inspect coatings without damaging the part under test.
Precision on difficult shapes
A dual sample-positioning system and a wide choice of collimators enable accurate measurement even of parts that are small or complex in shape — concave-convex, cornered and arched surfaces. This lets the EDX 2000A cope where standard measurement geometries fail.
Application and range
The analyser is suited to measuring single, double and composite electroplated coatings and samples of irregular shape. The element range from aluminium to uranium covers the layers typically used in electroplating. For analysing the composition of powder materials and alloys, the laboratory XRF spectrometers are intended; in the field, the portable XRF will do. Send an inquiry and you will quickly receive a price offer — write to us.