Handheld XRF spectrometer EDX-Pocket IV Genius of low weight and size and excellent performance measurement is suitable for both in field studies as well as in the laboratory stationary. XRF spectrometer Genius depending on the application module can be used as an analyzers for alloy composition, soil, precious metals, minerals and analyzers of hazardous substances. XRF analyzers can also be a great tool in areas such as determining the grade of ore, scrap metal analysis and recycling processes, etc. archaeological research.

XRF spectrometer Genius is equipped with the latest SDD detector with improved spectral resolution, HD camera, new improved analytical software using standard curves algorithms and FP. Optional helium system for performing detailed analysis of light elements XRF and improving the accuracy of the analysis of halides.

Genius XRF product line includes 4 analytical modules: RoHS analyzer Genius 3000XRF, alloy analyzer Genius 5000XRF, minerals analyzer Genius 7000XRF and heavy metals in soils analyzer Genius 9000XRF. Each of them has functions optimally adapting it to the working conditions, rapid identification of the test material and analysis for range of elements appropriate to the application. Measurement modules can be freely combined.

Published in Spectrometers XRF

EDX2000A Automatic Micro-area Film Thickness Analyzer is a top-illuminate film thickness tester specially developed by Skyray, which best exemplifies its multiple years of XRF film thickness measurement technology. Compared with the traditional coating thickness analyzer, it not only performs more excellently on the conventional plating, but also better meets the needs of non-contact micro-area coating thickness testing in industries such as semiconductor, chip and PCB. The instrument outlook is elegant with simple touch. Through automatic three-dimensional movement of platform along X, Y and Z-axis, dual laser positioning and security protection system, it can realize rapid focusing and accurate analysis of various simple and complex samples suchas planar,concave-convex,cornered and arc surfaces.

Published in Spectrometers XRF
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