Genius-IF XRF spectrometer
The Genius-IF benchtop EDXRF spectrometer with secondary reflective filters combines high-quality XRF measurements with economical elemental analysis. Non-destructive analysis from carbon (C6) to fermium (Fm100), an SDD detector with excellent resolution and a patented WAG system that lowers detection limits.
- Secondary reflective filters for optimal excitation
- Analysis range from carbon (C6) to fermium (Fm100)
- SDD detector with excellent spectral resolution
- Patented WAG (Wide Angle Geometry) system
- Eight reflective and eight direct-excitation filters
- Low detection limits, including light elements
The Genius-IF is the first benchtop EDXRF spectrometer with secondary reflective filters — a combination of high-quality XRF measurements and economical elemental analysis. It provides non-destructive quantitative and qualitative analysis in the range from carbon (C6) to fermium (Fm100), and the latest-generation SDD detector has excellent spectral resolution and detects elements from trace amounts up to 100%.
Reflective filters and the WAG system
The Genius-IF has a unique optical system combining eight secondary reflective filters and eight filters in the direct-excitation mode, which provides optimal excitation conditions for all elements detectable by the EDXRF method. The patented WAG (Wide Angle Geometry) system uses the reflective filters for optimal analysis of the major and trace elements in a sample.
Low detection limits
The X-ray beam excites the characteristic K lines of the reflective filters, which then excite the sample with a “monochromatic” beam — this significantly lowers the detection limits of individual elements. As a result, the Genius-IF also handles troublesome light-element analyses, which makes it one of the most versatile XRF spectrometers. For high-throughput measurements with a high-power tube, the X-Calibur is intended; for mineral analyses — the EDX3600H. Send an inquiry and you will quickly receive a price offer — write to us.