Spectrometer XRF EDX3600H is a energy dispersive laboratory X-ray fluorescence spectrometer EDXRF intended for elemental analysis in full scope. The advantage of the device in addition to the thermoelectric cooled SDD detector with a resolution of 135-145eV is the ability to work with in a vacuum atmosphere (for the analysis of light elements such as Al), and a large, opened from the top measuring chamber. It is possible to perform measurements in an open chamber, placing a sample of large or non-standard sizes. This model is particularly suitable for the analysis of samples of mineral and metal alloys. Spectrum separation technique improves the accuracy of simultaneous analysis of light elements.
XRF spectrometer EDX 6000B is a fully professional EDXRF spectrometer for fast and non-destructive analysis of the chemical composition, equipped with a modern electrically-cooled SDD detector. Due to the high sensitivity guarantees a high level of energy linearity properties of the spectrum and the high peak-to-background ratio. The spectrometer comes with a 10-position tray that allows quick and easy test multiple samples simultaneously. It is recommended for the analysis of samples of mineral and metal alloys in the cement industry, electroplating, metallurgy, etc. XRF X-ray fluorescence method works well in scientific research, where the user has only a small amount of the sample. In this model of XRF analyzer it is possible to perform calibration for analyzes RoHS Compliance with low detection limits for hazardous elements covered by Directive.
XRF spectrometer EDX 3000 is designed primarily for the analysis of precious metals in jewelry samples, coating thickness testing, testing RoHS Compliance. By using electrically-cooled Si-PIN detector with improved resolution enables separation of more complex alloys jewelry eg. white gold. Built-in camera allows precise measurement of selected point, which is especially important in the measurement of objects with low or irregular shapes such as rings, necklaces, etc. The spectrometer has an easy-to-use analysis software and the ability to add your own standards and create new calibration curves. Analysis by X-ray fluorescence XRF spectrometers are completely non-destructive, allow measurements of both raw materials and finished products.
XRF spectrometer EDX1800B is X-ray fluorescence analyzer designed for analysis of compliance with the RoHS / WEEE directive. Measurements are fast and fully non-destructive, so the device is suitable for the measurement of semi-finished and finished products. It finds particular use in the quality control of electrical and electronic products, in the toy industry and ceramic industry. The software has a convenient function PASS / FAIL when performing measurements of the presence of hazardous elements such as mercury, cadmium, lead and chromium. In addition, you can customize spectrometer to analyze the chemical composition of the alloys, then it can be applied also in the recycling and sorting of metals and metal industry.
XRF spectrometer EDX 880 is an easy-to-use analyzer for jewelry and other precious metal products, operating on the principle EDXRF spectrometer. The device works in the analysis of the chemical composition of typical jewelry alloys and in determining gold carats. Radiation source and detector (proportional counter) placed in the upper part of the housing allow for easier manipulation of the sample with non-uniform or curved surface. The spectrometer is recommended primarily for manufacturers of jewelry, jewelers, pawnshops, etc. Measurements by means of X-ray fluorescence spectrometers are completely non-destructive, so there are no concerns about the loss or damage to the test sample.
XRF spectrometer EDX3000 PLUS is the latest model of energy dispersive X-ray fluorescence spectrometer EDXRF, designed specifically for non-destructive analysis of alloys and products made of precious metals. It has an ergonomic design, user-friendly interface and professional software causing that elemental analysis becomes simple and quick. Thanks to modern SDD detector with improved resolution, it is possible to separate elements found in typical alloys and alloys and other samples of unknown composition eg. white gold (Au + Cu + Zn + Ni) alloys Ag + Sn, Pt + Au alloys, Au + W, pollution in precious metals alloys, catalysts, and others. Is well suited for refining and recycling. Spectrometers of this type are recommended primarily for measurements jewelry alloys in pawn shops, bureaux de change, in the jewelry production and refining of gold.
Handheld XRF spectrometer EDX-Pocket IV Genius of low weight and size and excellent performance measurement is suitable for both in field studies as well as in the laboratory stationary. XRF spectrometer Genius depending on the application module can be used as an analyzers for alloy composition, soil, precious metals, minerals and analyzers of hazardous substances. XRF analyzers can also be a great tool in areas such as determining the grade of ore, scrap metal analysis and recycling processes, etc. archaeological research.
XRF spectrometer Genius is equipped with the latest SDD detector with improved spectral resolution, HD camera, new improved analytical software using standard curves algorithms and FP. Optional helium system for performing detailed analysis of light elements XRF and improving the accuracy of the analysis of halides.
Genius XRF product line includes 4 analytical modules: RoHS analyzer Genius 3000XRF, alloy analyzer Genius 5000XRF, minerals analyzer Genius 7000XRF and heavy metals in soils analyzer Genius 9000XRF. Each of them has functions optimally adapting it to the working conditions, rapid identification of the test material and analysis for range of elements appropriate to the application. Measurement modules can be freely combined.
EDX2000A Automatic Micro-area Film Thickness Analyzer is a top-illuminate film thickness tester specially developed by Skyray, which best exemplifies its multiple years of XRF film thickness measurement technology. Compared with the traditional coating thickness analyzer, it not only performs more excellently on the conventional plating, but also better meets the needs of non-contact micro-area coating thickness testing in industries such as semiconductor, chip and PCB. The instrument outlook is elegant with simple touch. Through automatic three-dimensional movement of platform along X, Y and Z-axis, dual laser positioning and security protection system, it can realize rapid focusing and accurate analysis of various simple and complex samples suchas planar,concave-convex,cornered and arc surfaces.
