Spectrometer XRF EDX3000
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XRF spectrometer EDX 3000 is designed primarily for the analysis of precious metals in jewelry samples, coating thickness testing, testing RoHS Compliance. By using electrically-cooled Si-PIN detector with improved resolution enables separation of more complex alloys jewelry eg. white gold. Built-in camera allows precise measurement of selected point, which is especially important in the measurement of objects with low or irregular shapes such as rings, necklaces, etc. The spectrometer has an easy-to-use analysis software and the ability to add your own standards and create new calibration curves. Analysis by X-ray fluorescence XRF spectrometers are completely non-destructive, allow measurements of both raw materials and finished products.
Additional Info
| Model: | EDX 3000, energy dispersive precious metals and plating thickness analyzer | Application: | Goldsmithing, RoHS, Coating analysis | Analysis range: | 1 ppm - 99,99% | Detector: | Si-PIN | Energy resolution: | 155 +/- 5 eV | Measured elements: | Au, Ag, Pt, Pd, Cu, Zn, Ni, Sn, W | Measurement precision: | 0,05% (main element content more than 96%); 0,1% | Measurement atmosphere: | Air | Test time: | 60-200 s | Tube power: | 50W | Power: | 230V AC | Forms of samples: | solid, powder and liquid | Weight: | 30kg | Dimensions: | 310x300x100mm | Additional informations: | Standard configuration: the main unit with SDD detector, a built-in CCD camera, a set of filters and collimators with automatic changer, analytical software and a set of computer control and data acquisition. |
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Spectrometers XRF
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