Spectrophotometer UV-1800 is a versatile, universal UV-VIS spectrophotometer with scanning capabilities. It can be used in medical research, environmental monitoring, testing the quality of various products including food, in agro chemistry, for the purposes of research and training in universities, metallurgy, geology, production of machinery, petrochemical industry. It is a useful tool to perform qualitative and quantitative analysis.
It satisfies the different requirements of users. It has powerful spectrum editing functions including automatic peak search, counting derivative calculation of activity, the ability to convert the graph as a function of absorption on the transmittance and vice versa. This software also has a pre-defined functions for the analysis of proteins, RNA and DNA.
Spectrophotometer UV-9200 is a microprocessor controlled single beam, basic model of a UV-VIS spectrophotometer. It has a LCD display 16 × 2 and function of automatic setting of zero and 100%T. The calibration curve can be determined based on measurement, by specifying / measuring up to 10 patterns or the introduction of the coefficients of the curve K and B directly from the keyboard. The parameters can be stored in the cache unit for subsequent use. Has the ability to store up to 10 calibration curves that can be edited by the user.
Spectrophotometer VIS-7220G is a single beam, microprocessor-controlled VIS spectrometer, equipped with an LCD display 16 × 2. It features function of automatic setting of zero and 100%T. The calibration curve can be determined based on measurement, by giving up to 10 patterns or by directly entering the curve coefficients K and B. The parameters can be stored for later use. It has the ability to store up to 10 calibration curves that can be edited by the user. This is the basic model of the VIS spectrophotometer, easy to use and space-saving. Successfully performs well for educational purposes and for basic spectrophotometric analysis in analytical laboratories.
Spectrophotometer VIS-723G is a single beam VIS spectrophotometer scanning across the wavelength range 320-1100 nm (visible light). There are three options for spectral bandwidth selection: 5 nm, 2 nm and 1 nm that meet customer needs and the requirements of the European Pharmacopoeia. It is equipped with a manual four-chamber holder that can hold cells up to 100mm. Optimized for high-quality optics, electronics, light source and detector made by the world renowned manufacturers ensure high performance measurements and reliability .
EDX2000A Automatic Micro-area Film Thickness Analyzer is a top-illuminate film thickness tester specially developed by Skyray, which best exemplifies its multiple years of XRF film thickness measurement technology. Compared with the traditional coating thickness analyzer, it not only performs more excellently on the conventional plating, but also better meets the needs of non-contact micro-area coating thickness testing in industries such as semiconductor, chip and PCB. The instrument outlook is elegant with simple touch. Through automatic three-dimensional movement of platform along X, Y and Z-axis, dual laser positioning and security protection system, it can realize rapid focusing and accurate analysis of various simple and complex samples suchas planar,concave-convex,cornered and arc surfaces.
Handheld XRF spectrometer EDX-Pocket IV Genius of low weight and size and excellent performance measurement is suitable for both in field studies as well as in the laboratory stationary. XRF spectrometer Genius depending on the application module can be used as an analyzers for alloy composition, soil, precious metals, minerals and analyzers of hazardous substances. XRF analyzers can also be a great tool in areas such as determining the grade of ore, scrap metal analysis and recycling processes, etc. archaeological research.
XRF spectrometer Genius is equipped with the latest SDD detector with improved spectral resolution, HD camera, new improved analytical software using standard curves algorithms and FP. Optional helium system for performing detailed analysis of light elements XRF and improving the accuracy of the analysis of halides.
Genius XRF product line includes 4 analytical modules: RoHS analyzer Genius 3000XRF, alloy analyzer Genius 5000XRF, minerals analyzer Genius 7000XRF and heavy metals in soils analyzer Genius 9000XRF. Each of them has functions optimally adapting it to the working conditions, rapid identification of the test material and analysis for range of elements appropriate to the application. Measurement modules can be freely combined.
Compact XRF spectrometer S-MOBILE, thanks to a specially designed portable casing allows measurements in the field, when it is necessary to perform quick and accurate analysis. A high power XRF lamp (50kV, 50W) provides an analysis on the level of accuracy similar to the laboratory.
Xenemetrix spectrometer S-Mobile is simple to use, yet accurate and fully professional - works great where it is important to know the composition of the tested material. It is suitable for geological research, research in soil remediation, for rapid response units and numerous analyzes of in-situ processes.
Optionally available version of the ULS (Ultra Low Sulfur) - ideal for petrochemical applications and analysis of sulfur on the order of a single ppm levels, with a limit of detection of less than 1 ppm. Analysis in accordance with ASTM D4294 / 10, D7212, ISO 20847, IP 531 and others, defining a methodology of analysis of petroleum products without the need for helium scrubber.
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X-Cite is a basic spectrometer uses XRF technology to analyze samples without destroying them for universal applications. Advanced computational capabilities are integrated with the analyzer in order to ensure a consistent analysis and data transfer. It can be widely used in stationary laboratories and field ones in the enhanced casing options - ROBUST.
Primary applications: measurements of S in oils and fuels, Pb in gasoline, Ni and V in crude oil, S, Ni and V in the residual oil, the S in coke or coal, Mg, P, S, Ca, Ba, Zn, Mo in lubricating oils. In the forensic laboratories to identify traces found on the glass, steel, remnants of gunshots, car paint debris and ingredients for the production of drugs. Measurements in the cement industry: Na, Mg, Al, Si, S, K, Ca, and Fe in cement and clinker according to ASTM C-114.
XRF spectrometer X-CITE is also an excellent tool for the identification of the active ingredients in cosmetics and pharmaceuticals: Cr, Mn, Fe in the eye shadows; Fe, Ti and Zn foundation; Bi, Al, Ca, Mg in the antacids, laxatives; Analysis of personal care products (deodorants, preparations for hair care, teeth), antibacterial preparations; Ag, I and Zn in contact lenses; Ti and Zn in preparations with filters UVA / UVB rays.
X-CITE is also intended for measurements in the mining industry Zn metal, Zn powder, the production of ZnO; Fe metal, Fe powder, production of Fe2O3; -Al bauxite mining; Analyses of kaolin clay - pottery; tin ore, silver ore.
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Xenemetrix XRF spectrometer RoHS VISION is specifically designed to allow quick and easy analysis of the content of hazardous substances in accordance with the regulations concerning environmental protection RoHS (Directive on restriction of Hazardous Substances) and WEEE. Using RoHS VISION you can successfully carry out the analysis in accordance with all the requirements of RoHS, MCV verification procedures, using test procedures included in the bulletin IEC TC111. The analyzer combines proven Xenemetrix technology and a new intuitive technology Selective Acquisition Reflexive Matrix Technology (SMART), which allows the analysis of many complex materials without the knowledge of their composition.
RoHS Vision enables you to record the image of the analyzed area thanks to CCD camera with markers of dimensions for analysis of samples in micro and macro scale. The device is compact, with great analytical potential, yet easy to use for people who do not have extensive analytical knowledge.
Additionally spectrometer in the version of X-RoHS + SDD in addition to applications for analysis RoHS allows full qualitative and quantitative analysis in terms of F-Fm. It is equipped with SDD detector with optimized window for the measurement of light elements from fluorine. It is characterized by an extremely good resolution of 125 eV, so you can use it also for applications such as fuel analysis for sulfur, analysis of polymers, metallurgy, mineral analysis and forensics.
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XRF spectrometer Genius-IF first desktop EDXRF spectrometer with secondary reflections filters, is a combination of high-quality XRF measurements and economics at elemental analysis. This spectrometer provides a non-destructive qualitative and quantitative analysis in the range of C (6) Fm (100). The newest generation of the SDD detector has excellent spectral resolution and is optimized for the detection of elements in a wide range, also in troublesome so far XRF analysis of light elements.
IF Genius has a unique optical system combining eight secondary reflection filters, and eight filters in direct excitation mode. This ensures optimum excitation conditions for all elements detected by EDXRF. WAG (Wide Angle Geometry) is a patented by Xenemetrix system using reflective filter ensures optimal conditions for the analysis of the main elements and trace in the sample.
X-ray beam induces characteristic lines K for reflection filters (pure metal), which are then used to excite the sample with "monochromatic" beam. The use of filters enables a significant reduction in the detection limits for individual elements. Reduced detection limits make Genius IF unit most versatile and useful in a wide range of applications, including inaccessible to conventional EDXRF spectrometers.
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