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GC-MS analysis 6800
Gas ChromatographsThe GC-MS analysis 6800 is the latest product of Skyray Instruments combines high performance and quality analysis, and an attractive price and low operating costs. It uses modern solutions used…
Spectrometer XRF Genius-IF
Spectrometers XRFXRF spectrometer Genius-IF first desktop EDXRF spectrometer with secondary reflections filters, is a combination of high-quality XRF measurements and economics at elemental analysis. This spectrometer provides a non-destructive qualitative and…
Spectrometer XRF EDX3000 PLUS
Spectrometers XRFXRF spectrometer EDX3000 PLUS is the latest model of energy dispersive X-ray fluorescence spectrometer EDXRF, designed specifically for non-destructive analysis of alloys and products made of precious metals. It has…
Spectrometer XRF X-Calibur
Spectrometers XRFXRF spectrometer X-Calibur from company Xenemetrix is an X-ray fluorescence spectrometer EDXRF with high-power X-ray tube and compact construction. The analyzer offers high performance measurements and high resolution detector. The…
Spectrometer XRF EDX3600H
Spectrometers XRFSpectrometer XRF EDX3600H is a energy dispersive laboratory X-ray fluorescence spectrometer EDXRF intended for elemental analysis in full scope. The advantage of the device in addition to the thermoelectric cooled…
Gas chromatograph DPS Companion
Gas ChromatographsThe Companion GC is a portable gas chromatograph utilizing the same modular plug and play components, that are found in full size laboratory GC DPS 600. The performance of the…
XRF spectrometer Genius-IF first desktop EDXRF spectrometer with secondary reflections filters, is a combination of high-quality XRF measurements and economics at elemental analysis. This spectrometer provides a non-destructive qualitative and quantitative analysis in the range of C (6) Fm (100). The newest generation of the SDD detector has excellent spectral resolution and is optimized for the detection of elements in a wide range, also in troublesome so far XRF analysis of light elements.
IF Genius has a unique optical system combining eight secondary reflection filters, and eight filters in direct excitation mode. This ensures optimum excitation conditions for all elements detected by EDXRF. WAG (Wide Angle Geometry) is a patented by Xenemetrix system using reflective filter ensures optimal conditions for the analysis of the main elements and trace in the sample.
X-ray beam induces characteristic lines K for reflection filters (pure metal), which are then used to excite the sample with "monochromatic" beam. The use of filters enables a significant reduction in the detection limits for individual elements. Reduced detection limits make Genius IF unit most versatile and useful in a wide range of applications, including inaccessible to conventional EDXRF spectrometers.
Learn more? Visit: www.learnxrf.com


