The advanced upright reflected and transmitted light metallurgical microscope XJM600 series is a comprehensive model with multiple applications such as bright and dark field, DIC, polarizing observations, etc. Aimed at the semiconductor industry, wafer manufacturing, electronic information industry, metallurgical industry and so on, XJM600 series is developed for applications like FPD, circuit encapsulation, circuit substrate, material casting, metal and ceramic parts, precision moulds, etc. The ergonomic design enables your work with XJM600 series comfortable and relax.
CCD or digital camera can be attached for image capture and professional but user-friendly metallurgical analysis software is also available for option. In series XJM600 we have two models: XJM600B and XJM600T so we can choose of binocular and trinocular design. Swing type Abbe condenser NA=1.25 with iris diaphragm and filter guarantees high resulotion and quality of performanced images.
Measuring, research and laboratory apparatus, XRF Spectrometers, Chromatographs, GC-MS, UV-VIS, FTIR, Pumps, Mixers, Mills.
Colorimeters, Glossmeters, Spectrophotometers, Color and gloss measurers, Chambers for visual and color assessment
XRF Spectrometers, EDXRF, WDXRF, XRF for metal alloys, geology and pollution testing, XRF for RoHS
