Spectrometer XRF EDX2000A
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EDX2000A Automatic Micro-area Film Thickness Analyzer is a top-illuminate film thickness tester specially developed by Skyray, which best exemplifies its multiple years of XRF film thickness measurement technology. Compared with the traditional coating thickness analyzer, it not only performs more excellently on the conventional plating, but also better meets the needs of non-contact micro-area coating thickness testing in industries such as semiconductor, chip and PCB. The instrument outlook is elegant with simple touch. Through automatic three-dimensional movement of platform along X, Y and Z-axis, dual laser positioning and security protection system, it can realize rapid focusing and accurate analysis of various simple and complex samples suchas planar,concave-convex,cornered and arc surfaces.
Additional Info
| Model: | EDX2000A - EDXRF spectrometer for measuring the thickness and composition of metallic coatings | Application: | Alloy analysis, Coating analysis | Analysis range: | 0.1% - 99.99% | Detector: | SDD | Energy resolution: | approx. 140 eV | Measured elements: | from Al to U | Measurement precision: | 0.5% | Measurement atmosphere: | Air | Tube power: | 50kV/1000µA | Power: | 230V AC | Forms of samples: | solid | Weight: | approx. 60 kg | Sample chamber dimensions: | 430 x 400 x 140mm | Dimensions: | 485 x 588 x 505mm | Additional informations: | Mobile platform. Dual laser positioning system with a high-resolution camera. A collimator mounted depending on application requirements. |
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